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Electron and hole trapping in polycrystalline metal oxide materials

✍ Scribed by McKenna, K. P.; Shluger, A. L.


Book ID
121692844
Publisher
The Royal Society
Year
2011
Tongue
English
Weight
462 KB
Volume
467
Category
Article
ISSN
0962-8444

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πŸ“œ SIMILAR VOLUMES


Electron and hole trapping in thermal ox
✍ B.J Mrstik; H.L Hughes; P.J McMarr; P Gouker πŸ“‚ Article πŸ“… 2001 πŸ› Elsevier Science 🌐 English βš– 141 KB

Photo-assisted charge injection techniques in conjunction with capacitance-voltage measurements have been used to study 16 22 electron and hole trapping in thermal oxides implanted with up to 1 3 10 cm Si or Ar. Defects having large cross sections for electron trapping and photoionization are found