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Electromigration testing of Ti/Al-Si metallization for integrated circuits : Jose A. Maiz and Babak Sabi. Annual Proceedings of the Reliability Physics Symposium, San Diego, U.S.A., p. 145 (1987)


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
127 KB
Volume
28
Category
Article
ISSN
0026-2714

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