Electromigration testing of Ti/Al-Si metallization for integrated circuits : Jose A. Maiz and Babak Sabi. Annual Proceedings of the Reliability Physics Symposium, San Diego, U.S.A., p. 145 (1987)

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 127 KB
• Volume: 28
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(88)90024-8