✦ LIBER ✦
The effect of Cu addition to Al-Si interconnects on stress induced open-circuit failures : S. Mayumi, T. Unemoto, M. Shishino, H. Nanatsue, S. Ueda and M. Inoue. Annual Proceedings of the Reliability Physics Symposium, San Diego, U.S.A., p. 15 (1987)
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 130 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.