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Electromigration stress induced deformation mechanisms in free-standing platinum thin films

✍ Scribed by S. Kumar; M.T. Alam; Z. Connell; M.A. Haque


Book ID
113899027
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
474 KB
Volume
65
Category
Article
ISSN
1359-6462

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