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Mechanical Stress in Immobilized Polycation Thin Films Induced by Ion-Exchange

✍ Scribed by Langer, James L.; Economy, James; Cahill, David G.

Book ID
126934348
Publisher
American Chemical Society
Year
2012
Tongue
English
Weight
809 KB
Volume
1
Category
Article
ISSN
2161-1653

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Samples consisting of 75 nm Ni films deposited on Si substrates were bent mechanically and irradiated with 200 keV Xe-ions at a dose of 4 β€’ 10 14 ions/cm 2 . Magneto-optical Kerr effect, Rutherford backscattering spectrometry and X-ray diffraction were used to investigate the changes in the magnetic