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Electromechanical Characterization of Au Thin Films using Micro-tensile Testing

✍ Scribed by S. J. Lee; J. M. Park; S. W. Han; S. M. Hyun; J. H. Kim; H. J. Lee


Book ID
106574349
Publisher
Sage Publications
Year
2009
Tongue
English
Weight
476 KB
Volume
50
Category
Article
ISSN
0014-4851

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