✦ LIBER ✦
Mechanical characterization of single crystal silicon and UV-LIGA nickel thin films using tensile tester operated in AFM
✍ Scribed by Y. LEE; J. TADA; Y. ISONO
- Book ID
- 109014072
- Publisher
- John Wiley and Sons
- Year
- 2005
- Tongue
- English
- Weight
- 445 KB
- Volume
- 28
- Category
- Article
- ISSN
- 8756-758X
No coin nor oath required. For personal study only.