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Density measurement of thin-films for micro-electromechanical systems using micro-cantilever structures

✍ Scribed by E.J. Boyd; V. Nock; X. Li; D. Uttamchandani


Book ID
113937158
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
815 KB
Volume
519
Category
Article
ISSN
0040-6090

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The mechanical behavior of interfaces between silicon oxide and metallic thin films is investigated using an alternative approach which is based on the miniaturized cantilever deflection technique (Weihs et al., 1988 [1]). The critical energy release rates for three different silicon oxide/metal sys