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Measurement of static and dynamic mechanical behavior of micro and nano-scale thin metal films: using micro-cantilever beam deflection

โœ Scribed by Ya-Chi Cheng; Chi-Jia Tong; Ming-Tzer Lin


Publisher
Springer-Verlag
Year
2011
Tongue
English
Weight
657 KB
Volume
17
Category
Article
ISSN
0946-7076

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