Electroluminescence and structural characteristics of InAs/In0.1Ga0.9As quantum dots grown on graded Si1-xGex/Si substrate
β Scribed by Tanoto, H.; Yoon, S. F.; Lew, K. L.; Loke, W. K.; Dohrman, C.; Fitzgerald, E. A.; Tang, L. J.
- Book ID
- 118150717
- Publisher
- American Institute of Physics
- Year
- 2009
- Tongue
- English
- Weight
- 672 KB
- Volume
- 95
- Category
- Article
- ISSN
- 0003-6951
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We present the heterogeneous growth of InAs quantum dots (QDs) on Si platform using GaAs/Ge/ Si 1 Γ x Ge x /Si substrate. Self-assembled InAs QDs were grown on GaAs/Ge/Si 1 Γ x Ge x /Si substrate by employing molecular beam epitaxy (MBE). The areal density, width and height of QDs were characterized
We report on round quantum dots grown on InP (100) substrate, which emit around 1.55 mm. At 10 K the full width at half maximum is as small as 28 meV, attesting a rather uniform size distribution. The carrier lifetimes are almost the same across the whole photoluminescence band, indicating the good