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Distribution of germanium in Si1 −xGex(x< 0.1) layers grown on the Si(001) substrate as a function of layer thickness

✍ Scribed by V. S. Bagaev; V. S. Krivobok; V. P. Martovitsky; A. V. Novikov


Book ID
111439523
Publisher
Springer
Year
2009
Tongue
English
Weight
988 KB
Volume
109
Category
Article
ISSN
1063-7761

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