In order to elucidate the influence of thickness and amorphous structure on the kinetics of electron exchange with redox couples in solution, a critical reexamination of the energetica at thk amorphous anodic WO, films (a-WO&-electrolyte junction has been performed, based on a recent theory of amorp
Electrochemistry of Silicon || The Semiconductor-Electrolyte Junction
✍ Scribed by Lehmann, Volker
- Publisher
- Wiley-VCH Verlag GmbH
- Year
- 2002
- Weight
- 120 KB
- Category
- Article
- ISBN-13
- 9783527600274
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