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Electrical properties of metal/GaN and SiO2/GaN interfaces and effects of thermal annealing

✍ Scribed by T Sawada; Y Ito; K Imai; K Suzuki; H Tomozawa; S Sakai


Book ID
108416165
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
303 KB
Volume
159-160
Category
Article
ISSN
0169-4332

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