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Electrical instabilities of Al-anodic oxide-n-GaAs MOS structures and the effect of annealing

✍ Scribed by B.M. Arora; A.M. Narsale

Book ID: 107862572
Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 513 KB
Volume: 56
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(79)90060-9

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