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Electrical Effects of Point Defect Clouds at Dislocations in Silicon, Studied by Deep Level Transient Spectroscopy

✍ Scribed by Schröter, Wolfgang; Kveder, Vitaly; Hedemann, Henrik


Book ID
119960894
Publisher
Trans Tech Publications, Ltd.
Year
2001
Tongue
English
Weight
447 KB
Volume
82-84
Category
Article
ISSN
1662-9779

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