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Electrical characterization of Si(100) surface at p-Si/SiGe/Si structure using low temperature Hall measurement analysis

✍ Scribed by Gholizadeh Arashti, Maryam; Sadeghzadeh, Mohammad Ali


Book ID
120524998
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
688 KB
Volume
93
Category
Article
ISSN
0042-207X

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