Low-temperature electrical characterization of the Ti–Si(100) interface at the p-Si/SiGe/Si–Ti structure using Hall measurement analysis

✍ Scribed by Arashti, Maryam Gholizadeh; Sadeghzadeh, Mohammad Ali

• Book ID: 121373638
• Publisher: Royal Swedish Academy of Sciences
• Year: 2013
• Tongue: English
• Weight: 404 KB
• Volume: 88
• Category: Article
• ISSN: 0031-8949
• DOI: 10.1088/0031-8949/88/02/025701