✦ LIBER ✦
Structural characterization of low temperature Epi-silicon grown on {100} and {111} Si substrates using ultrahigh resolution cross-sectional TEM
✍ Scribed by Zhizhen Ye; Yaping Liu; Zhen-Hong Zhou; Rafael Reif
- Book ID
- 112819604
- Publisher
- Springer US
- Year
- 1993
- Tongue
- English
- Weight
- 913 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0361-5235
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