Structural and electrical properties of
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Jyothi, I. ;Reddy, V. Rajagopal ;Reddy, M. Siva Pratap ;Choi, Chel-Jong ;Bae, Jo
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Article
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2010
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John Wiley and Sons
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English
β 564 KB
## Abstract Thermal annealing effects on the electrical and structural properties of Ni/Mo Schottky contacts on nβtype GaN have been investigated by currentβvoltage (__IβV__), capacitanceβvoltage (__CβV__), Secondary ion mass spectrometer (SIMS), and Xβray diffraction (XRD) techniques. The extracte