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Electrical characterisation of hole traps in n-type GaN

✍ Scribed by Auret, F. D. ;Meyer, W. E. ;Wu, L. ;Hayes, M. ;Legodi, M. J. ;Beaumont, B. ;Gibart, P.

Book ID: 105362705
Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 114 KB
Volume: 201
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.200404842

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