Deep electronic states associated with a metastable hole trap in n-type GaN

✍ Scribed by D. Emiroglu; J.H. Evans-Freeman; M.J. Kappers; C. McAleese; C.J. Humphreys

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 168 KB
• Volume: 401-402
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/j.physb.2007.08.175