𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Electrical and structural characterization of AlGaN/GaN field-effect transistors with recessed gate

✍ Scribed by M. Mikulics; A. Fox; M. Marso; D. Grützmacher; D. Donoval; P. Kordoš


Book ID
113940851
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
362 KB
Volume
86
Category
Article
ISSN
0042-207X

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES