Residual strain in recessed AlGaN/GaN heterostructure field-effect transistors evaluated by micro photoluminescence measurements

✍ Scribed by Martin Mikulics; Hilde Hardtdegen; Andreas Winden; Alfred Fox; Michel Marso; Zdeněk Sofer; Hans Lüth; Detlev Grützmacher; Peter Kordoš

• Book ID: 112182287
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 250 KB
• Volume: 9
• Category: Article
• ISSN: 1862-6351
• DOI: 10.1002/pssc.201100408