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Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals

✍ Scribed by P. Basa; A.S. Alagoz; T. Lohner; M. Kulakci; R. Turan; K. Nagy; Zs.J. Horváth

Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
338 KB
Volume
254
Category
Article
ISSN
0169-4332

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