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Characterization of Sn and Si nanocrystals embedded in SiO2 matrix fabricated by magnetron co-sputtering

✍ Scribed by Shihua Huang; Yongyue Chen; Hong Xiao; Fang Lu

Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 520 KB
Volume: 205
Category: Article
ISSN: 0257-8972
DOI: 10.1016/j.surfcoat.2010.08.142

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