EIS characterization of tantalum and niobium oxide films based on a modification of the point defect model

✍ Scribed by Román Cabrera-Sierra; José Manuel Hallen; Jorge Vazquez-Arenas; Gerardo Vázquez; Ignacio González

• Book ID: 108167820
• Publisher: Elsevier
• Year: 2010
• Tongue: English
• Weight: 706 KB
• Volume: 638
• Category: Article
• ISSN: 1572-6657
• DOI: 10.1016/j.jelechem.2009.10.021