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Synthesis, structuring and characterization of rare earth oxide thin films: Modeling of the effects of stress and defects on the phase stability

✍ Scribed by Gaboriaud, R.J.; Paumier, F.; Lacroix, B.


Book ID
123093826
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
545 KB
Volume
553
Category
Article
ISSN
0040-6090

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