The semiconducting properties of passive films formed on AISI 316 L and AISI 321 stainless steels: A test of the point defect model (PDM)

✍ Scribed by A. Fattah-alhosseini; F. Soltani; F. Shirsalimi; B. Ezadi; N. Attarzadeh

• Book ID: 116385744
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 397 KB
• Volume: 53
• Category: Article
• ISSN: 0010-938X
• DOI: 10.1016/j.corsci.2011.05.063