✦ LIBER ✦

Effects ofin situthermal annealing on the transmission intensity and electrical properties in Hg0.8Cd0.2Te epilayers grown on CdTe buffer layers

✍ Scribed by Y. S. Ryu; B. S. Song; T. W. Kang; H. J. Kim; T. W. Kim

Book ID: 110392455
Publisher: Springer
Year: 2002
Tongue: English
Weight: 82 KB
Volume: 21
Category: Article
ISSN: 0261-8028
DOI: 10.1023/a:1020036129015

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Annealing effects on the microstructural

Annealing effects on the microstructural and optical properties of Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

✍ Y. S. Ryu; T. W. Kang; T. W. Kim 📂 Article 📅 2005 🏛 Springer 🌐 English ⚖ 503 KB

Effects of in situ thermal annealing on

Effects of in situ thermal annealing on the structural, optical, and electrical properties in Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

✍ Y.S. Ryu; T.W. Kang; T.W. Kim 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 462 KB

Dependence of the microstructural and th

Dependence of the microstructural and the electrical properties on the annealing temperature and Hg-cell fluxes for in situ annealed Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

✍ Y.S. Ryu; T.W. Kang; T.W. Kim 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 237 KB

Scanning electron microscopy images showed that the surface morphologies of in situ annealed Hg 0.7 Cd 0.3 Te epilayers grown on CdTe buffer layers by using molecular beam epitaxy were mirror-like with no indication of pinholes. Selected area electron diffraction patterns and high-resolution transmi

Dependence of the structural and the ele

Dependence of the structural and the electrical properties on the Hg/Te flux-rate ratios for Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

✍ Y. S. Ryu; B. S. Song; T. W. Kang; T. W. Kim 📂 Article 📅 2004 🏛 Springer 🌐 English ⚖ 143 KB