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Effects of in situ thermal annealing on the structural, optical, and electrical properties in Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

✍ Scribed by Y.S. Ryu; T.W. Kang; T.W. Kim

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 462 KB
Volume: 253
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2006.05.028

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