Annealing effects on the microstructural and optical properties of Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers
โ Scribed by Y. S. Ryu; T. W. Kang; T. W. Kim
- Publisher
- Springer
- Year
- 2005
- Tongue
- English
- Weight
- 503 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0022-2461
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Scanning electron microscopy images showed that the surface morphologies of in situ annealed Hg 0.7 Cd 0.3 Te epilayers grown on CdTe buffer layers by using molecular beam epitaxy were mirror-like with no indication of pinholes. Selected area electron diffraction patterns and high-resolution transmi
## Abstract InN thin films grown by MOVPE with a thickness of about 100 nm are investigated. Growth was carried out in either two or three steps: deposition of a low temperature nucleation layer at 400 ยฐC and subseโ quent growth of a thicker InN layer at 530 ยฐC, or use of a GaN buffer layer which w