๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Annealing effects on the microstructural and optical properties of Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

โœ Scribed by Y. S. Ryu; T. W. Kang; T. W. Kim


Publisher
Springer
Year
2005
Tongue
English
Weight
503 KB
Volume
40
Category
Article
ISSN
0022-2461

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Dependence of the microstructural and th
โœ Y.S. Ryu; T.W. Kang; T.W. Kim ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 237 KB

Scanning electron microscopy images showed that the surface morphologies of in situ annealed Hg 0.7 Cd 0.3 Te epilayers grown on CdTe buffer layers by using molecular beam epitaxy were mirror-like with no indication of pinholes. Selected area electron diffraction patterns and high-resolution transmi

Effects of the low temperature buffer an
โœ Ruterana, P. ;Morales, M. ;Gourbilleau, F. ;Singh, P. ;Drago, M. ;Schmidtling, T ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 214 KB

## Abstract InN thin films grown by MOVPE with a thickness of about 100 nm are investigated. Growth was carried out in either two or three steps: deposition of a low temperature nucleation layer at 400 ยฐC and subseโ€ quent growth of a thicker InN layer at 530 ยฐC, or use of a GaN buffer layer which w