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The Effect of Annealing Temperature on the Electron Concentration of Hg0.3Cd0.7Te

✍ Scribed by Zhang, J. ;Thuillier, J. C.

Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
310 KB
Volume
77
Category
Article
ISSN
0031-8965

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Scanning electron microscopy images showed that the surface morphologies of in situ annealed Hg 0.7 Cd 0.3 Te epilayers grown on CdTe buffer layers by using molecular beam epitaxy were mirror-like with no indication of pinholes. Selected area electron diffraction patterns and high-resolution transmi