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Dependence of the structural and the electrical properties on the Hg/Te flux-rate ratios for Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

โœ Scribed by Y. S. Ryu; B. S. Song; T. W. Kang; T. W. Kim

Book ID
111589978
Publisher
Springer
Year
2004
Tongue
English
Weight
143 KB
Volume
39
Category
Article
ISSN
0022-2461

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Dependence of the microstructural and th
Dependence of the microstructural and the electrical properties on the annealing temperature and Hg-cell fluxes for in situ annealed Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers
โœ Y.S. Ryu; T.W. Kang; T.W. Kim ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 237 KB

Scanning electron microscopy images showed that the surface morphologies of in situ annealed Hg 0.7 Cd 0.3 Te epilayers grown on CdTe buffer layers by using molecular beam epitaxy were mirror-like with no indication of pinholes. Selected area electron diffraction patterns and high-resolution transmi