✦ LIBER ✦

Effects of scaling on the impact ionization and sub‐threshold current in submicron MOSFETs

✍ Scribed by Jharia, Bhavana; Sarkar, S.; Agarwal, R.P.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

The impact of device scaling on the curr

✍ Ming-Horn Tsai; Tso-Ping Ma 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 819 KB

On the reverse short channel effect in d

✍ Collaert, N.; Verheyen, P.; De Meyer, K. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 186 KB

Evaluation of the effective threshold en

✍ Borzdov, V. M.; Borzdov, A. V.; Speransky, D. S.; V’yurkov, V. V.; Orlikovsky, A 📂 Article 📅 2014 🏛 Springer 🌐 English ⚖ 369 KB

A study of the effects of tunneling curr

✍ Nian Yang; Jimmie J Wortman 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 679 KB

On the origin of increase in substrate c

✍ Irisawa, T.; Numata, T.; Sugiyama, N.; Takagi, S. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 409 KB

Modeling of the effect of uniaxial mecha

✍ Chaudhry, Amit; Sangwan, Sonu 📂 Article 📅 2013 🏛 Elsevier Science 🌐 English ⚖ 696 KB