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Effects of N+ implantation on CoSi2 contacts on shallow junctions

✍ Scribed by K.M. Chen; S.L. Cheng; L.J. Chen; B.Y. Tsui


Book ID
114194406
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
528 KB
Volume
54
Category
Article
ISSN
0254-0584

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