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Effects of iron contamination in silicon on thin oxide breakdown and reliability characteristics

โœ Scribed by Worth B. Henley; Lubek Jastrzebski; Nadim F. Haddad


Book ID
115990348
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
419 KB
Volume
187
Category
Article
ISSN
0022-3093

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