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Effects of interface traps on the transconductance and drain current of InP MISFET's

โœ Scribed by Chen, C.-L.; Calawa, A.R.; Courtney, W.E.; Mahoney, L.J.; Palmateer, S.C.; Manfra, M.J.; Hollis, M.A.


Book ID
114534680
Publisher
IEEE
Year
1992
Tongue
English
Weight
897 KB
Volume
39
Category
Article
ISSN
0018-9383

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