๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Effects of hot-carrier stress on the performance of the LC-tank CMOS oscillators

โœ Scribed by Naseh, S.; Deen, M.J.; Marinov, O.


Book ID
114617091
Publisher
IEEE
Year
2003
Tongue
English
Weight
388 KB
Volume
50
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES