A new test structure for direct measurement of hot-carrier stress effects on CMOS circuit performance

✍ Scribed by Hu, S.C.; Brassington, M.P.

• Book ID: 114534457
• Publisher: IEEE
• Year: 1991
• Tongue: English
• Weight: 196 KB
• Volume: 38
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.119039