g-irradiation induced defects ( 60 Co, dose of 3 ร 10 19 cm ร2 ) in n-GaN epilayers with a carrier concentration of 10 17 cm ร3 (slightly doped) and 10 18 cm ร3 (heavily doped) grown by low-pressure MOCVD on (0001) sapphire substrates have been investigated. The g-irradiation decreases the electron
โฆ LIBER โฆ
Effects of annealing on the luminescent properties from defects formed in electron-irradiated GaN
โ Scribed by L.M. Liang; X.J. Xie; Q.Y. Hao; Y. Tian; C.C. Liu
- Book ID
- 118496134
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 468 KB
- Volume
- 47
- Category
- Article
- ISSN
- 1350-4487
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