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Effects of Annealing on Structural and Electrical Properties of CuInSe2Thin Films Prepared by Hybrid Sputtering/Evaporation Processes

✍ Scribed by Qifeng Han; Qiang Liu; Chenghong Duan; Guoping Du; Wangzhou Shi

Book ID
107457260
Publisher
Springer US
Year
2011
Tongue
English
Weight
411 KB
Volume
40
Category
Article
ISSN
0361-5235

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Thin films of ZrO 2 were prepared by reactive magnetron sputtering. Annealing of the films exhibited a drastic change in the properties due to improved crystallinity and packing density. The root mean square roughness of the sample observed from atomic force microscope is about 5.75 nm which is comp