✦ LIBER ✦

Effects of AC hot carrier stress on n- and p-MOSFET's with oxynitride gate dielectrics

✍ Scribed by Joshi, A.B.; Kwong, D.L.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Hot carrier effects on analog performanc

✍ Joshi, A.B.; Dim-Lee Kwong 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 348 KB

Effects of hot-carrier trapping in n- an

✍ Ng, K.K.; Taylor, G.W. 📂 Article 📅 1983 🏛 IEEE 🌐 English ⚖ 602 KB

Comparison of gate-edge effects on the h

✍ Y. Pan; K.K. Ng; V. Kwong 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 448 KB

Hot-carrier reliability of N- and P-chan

✍ C.L. Lou; W.K. Chim; D.S.H. Chan; Y. Pan 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 261 KB

Effects of measurement frequency and tem

✍ Liang, C.H.; Ang, D.S.; Tan, S.E. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 804 KB

A comprehensive study of hot-carrier ins

✍ Hsu, C.C.-H.; Duen-Shun Wen; Wordeman, M.R.; Yuan Taur; Ning, T.H. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 560 KB