A comprehensive study of hot-carrier instability in p- and n-type poly-Si gated MOSFET's

✍ Scribed by Hsu, C.C.-H.; Duen-Shun Wen; Wordeman, M.R.; Yuan Taur; Ning, T.H.

• Book ID: 114535693
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 560 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.285016