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Effect of thermal coupling on the electronic properties of hydrogenated amorphous silicon thin films deposited by electron cyclotron resonance

✍ Scribed by T.H. Dao; M.E. Gueunier-Farret; D. Daineka; P. Bulkin; P. Roca i Cabarrocas; J.P. Kleider; C. Longeaud; C. Bazin; T. Kervyn de Meerendre; P. Descamps; P. Leempoel

Book ID: 111713856
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 247 KB
Volume: 515
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2006.11.105

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