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Effect of Substrate Orientation, Roughness, and Film Deposition Mode on the Tensile Strength and Toughness of Niobium–Sapphire Interfaces

✍ Scribed by Vijay Gupta; Jianxin Wu; Alexander N. Pronin


Book ID
110827401
Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
685 KB
Volume
80
Category
Article
ISSN
0002-7820

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