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Effect of Radiation Source on the Degradation in Irradiated Si1−xGex Epitaxial Devices

✍ Scribed by Ohyama, H. ;Vanhellemont, J. ;Takami, Y. ;Hayama, K. ;Sunaga, H. ;Poortmans, J. ;Caymax, M.


Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
534 KB
Volume
155
Category
Article
ISSN
0031-8965

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