✦ LIBER ✦

Effect of Ni residues on the performance and the uniformity of nickel-induced lateral crystallization polycrystalline silicon nanowire thin-film transistors

✍ Scribed by Bau-Ming Wang; Tzu-Ming Yang; YewChung Sermon Wu; Chun-Jung Su; Horng-Chih Lin

Book ID: 113783869
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 346 KB
Volume: 124
Category: Article
ISSN: 0254-0584
DOI: 10.1016/j.matchemphys.2010.08.018

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Effect of Ni silicide density on electri

Effect of Ni silicide density on electrical performance of silicide-induced crystallized polycrystalline silicon thin-film transistors

✍ Chang Woo Byun, A. Mallikarjuna Reddy, Se Wan Son, Seung Ki Joo 📂 Article 📅 2012 🏛 The Korean Institute of Metals and Materials 🌐 English ⚖ 995 KB

The Electrical Properties of Unidirectio

The Electrical Properties of Unidirectional Metal-Induced Lateral Crystallized Polycrystalline-Silicon Thin-Film Transistors

✍ Nam-Kyu Song; Min-Sun Kim; Shin-Hee Han; Young-Su Kim; Seung-Ki Joo 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 532 KB

High performance polycrystalline thin-fi

High performance polycrystalline thin-film transistors formed by copper metal induced unidirectional crystallization

✍ Young-Su Kim; Min-Kyu Lee; Bong-Kwan Shin; Yong-Woo Lee; Jin-Hyun Park; Seung-Ki 📂 Article 📅 2009 🏛 The Korean Institute of Metals and Materials 🌐 English ⚖ 695 KB

The effects of extended heat treatment o

The effects of extended heat treatment on Ni induced lateral crystallization of amorphous silicon thin films

✍ Zhonghe Jin; Moulding, K.; Kwok, H.S.; Wong, M. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 324 KB

Gettering of Ni silicide to minimize the

Gettering of Ni silicide to minimize the leakage current in metal-induced crystallized polycrystalline silicon thin-film transistors

✍ Chang Woo Byun, Se Wan Son, Yong Woo Lee, Hyun Mo Kang, Seol Ah Park, Woo Chang 📂 Article 📅 2012 🏛 The Korean Institute of Metals and Materials 🌐 English ⚖ 650 KB

Effect of nickel concentration on source

Effect of nickel concentration on source/drain series resistance and channel resistance of Ni-metal-induced crystallization thin-film transistors

✍ Lai, Ming-Hui; Wu, YewChung Sermon; Huang, Jung-Jie 📂 Article 📅 2013 🏛 Elsevier Science 🌐 English ⚖ 693 KB