Effect of nickel concentration on source/drain series resistance and channel resistance of Ni-metal-induced crystallization thin-film transistors

✍ Scribed by Lai, Ming-Hui; Wu, YewChung Sermon; Huang, Jung-Jie

• Book ID: 123259833
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 693 KB
• Volume: 544
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2013.01.042