✦ LIBER ✦

Effect of final annealing on hot-electron-induced MOSFET degradation

✍ Scribed by Hsu, F.-C.; Hui, J.; Chiu, K.Y.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Trapped-electron and generated interface

✍ Tsuchiya, T. 📂 Article 📅 1987 🏛 IEEE 🌐 English ⚖ 706 KB

The combined effects of deuterium anneal

✍ Ference, T.G.; Burnham, J.S.; Clark, W.F.; Hook, T.B.; Mittl, S.W.; Watson, K.M. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 207 KB

Modeling of hot-electron-induced charact

✍ H. Wong; Y.C. Cheng 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 641 KB

Hot-electron-induced degradation of conv

✍ Liou, T.-I.; Teng, C.-S.; Merrill, R.B. 📂 Article 📅 1988 🏛 IEEE 🌐 English ⚖ 713 KB

Effect of mobile charge on hot-carrier d

✍ Wei, T. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 178 KB

Physical characterization of hot-electro

✍ Bergonzoni, C.; Libera, G.D. 📂 Article 📅 1992 🏛 IEEE 🌐 English ⚖ 666 KB