✦ LIBER ✦

Trapped-electron and generated interface-trap effects in hot-electron-induced MOSFET degradation

✍ Scribed by Tsuchiya, T.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Hole trapping and hot-hole induced inter

✍ G. Van den Bosch; G. Groeseneken; P. Heremans; M. Heyns; H.E. Maes 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 240 KB

The role of electron traps on the post-s

✍ Ang, D.S.; Ling, C.H. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 280 KB

Lateral distribution of hot-carrier-indu

✍ Ancona, M.G.; Saks, N.S.; McCarthy, D. 📂 Article 📅 1988 🏛 IEEE 🌐 English ⚖ 895 KB

Effect of final annealing on hot-electro

✍ Hsu, F.-C.; Hui, J.; Chiu, K.Y. 📂 Article 📅 1985 🏛 IEEE 🌐 English ⚖ 253 KB

Hot-electron-induced degradation in MOSF

✍ Bracchitta, J.A.; Honan, T.L.; Anderson, R.L. 📂 Article 📅 1985 🏛 IEEE 🌐 English ⚖ 829 KB

Two types of interface traps induced by

✍ N.C. Das; V. Nathan 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 280 KB